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Anglo–American Microelectronics Data 1968–69. Manufacturers by G. W. A. Dummer, J. Mackenzie Robertson

By G. W. A. Dummer, J. Mackenzie Robertson

Anglo-American Microelectronics info 1968-69, quantity : brands R-Z provides details at the gains of the layout, development and alertness of microelectronic units. The ebook discusses the positive factors of the layout, development and alertness of radiation built-in circuits; Raytheon built-in circuits; RCA built-in circuits; and Signetics built-in circuits. The textual content additionally describes the good points of the layout, building and alertness of Siliconix built-in circuits; Sperry built-in circuits; Sprague built-in circuits; and STC thick movie circuits. The gains of the layout, development and alertness of Stewart-Warner micro circuits; Sylvania built-in circuits; Texas tools semiconductor networks; and transitron built-in circuits also are encompassed. The publication additional tackles the beneficial properties of the layout, building and alertness of Varo hybrid movie built-in circuits; Welwyn thick movie and skinny movie resistor networks; Westinghouse built-in circuits; and Zeltex hybrid built-in circuits. Designers, purchasers, and clients of microelectronic units will locate the publication important.

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Extra info for Anglo–American Microelectronics Data 1968–69. Manufacturers R–Z

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All test equipment calibrated to meet requirements of MIL-Q-9858 and MIL-C-45662. 1 2. Details of tests, conditions and limits are given in the STATIC ELECTRICAL CHARACTERISTICS Table. 3. Details of tests, conditions and limits are given in the table SWITCHING (DYNAMIC) CHARACTERISTICS. 1583 Continued RADIATION RD-209 (Contd) RADIATION INTEGRATED CIRCUIT RELIABILITY PROGRAM The Radiation Integrated Circuit Reliability Program consists of 1 0 0 % environmental screening and statistical sampling tests designed to assure performance as specified herein, and provides for continuing uniformity bility in Radiation extra cost products.

ACCEPTANCE NO. 2 2 2. Details of tests, conditions and limits are given in the STATIC ELECTRICAL CHARACTERISTICS Table. 3. Details of tests, conditions and limits are given in the table SWITCHING (DYNAMIC) CHARACTERISTICS. i c Q / I RD-223 (Contd) RADIATION INTEGRATED CIRCUITS TYPICAL PERFORMANCE CHARACTERISTICS NOTiS: 1. This specification is written for one driver element. With multiple element packages, all elements within the package must qualify for the package to obtain "type" classification.

By selectively opening fuses, diodes are effectively removed from the circuit to form any desired matrix pattern. Radiation's automatic production test equipment provides instantaneous code pattern customizing from finished goods inventory. Combining the fusing technique with the availability of various matrix sizes and the possibility of assembling several matrices to form larger arrays, provides designers with the necessary flexibility in system design. The matrices meet full military temperature range operation (-55°C to + 125°C) and the circuits are designed to meet or exceed the mechanical and environmental requirements of MIL-S-19500.

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